Hyong-Gon Lee. and Jin-Ki Kii Semi conductor Researck aamp; Development Center Samsung Semiconductor aamp; Te ... novel reliable EEPROM redundancy circuit end test circuits for tke screen of defective cells are also designed into tke ckip. ... SV- only power supply, cost effective plastic package, fast programing speed, and typically sore tkan 10.888 program/ ... graded junctions ere selectively formed by e doukle ion implant technique- Figure 1 is functional klock diagram of tke EEPROM.
|Title||:||Computers and communications technology toward 2000|
|Author||:||Institute of Electrical and Electronics Engineers. Korea Section, IEEE Region 10, Taehan Chŏnja Konghakhoe|