For more than three decades the Electroanalytical Chemistry series has delivered the most in-depth and critical research related to issues in electrochemistry. Volume 22 continues this gold-standard with practical reviews of recent applications, as well as innovative contributions from internationally respected specialistsahighlighting the emergence of new technologies and trends in the field. Previous volumes in the series were ahighly recommendeda by the Journal of the American Chemical Society and considered aessentiala by the Journal of Solid State Electrochemistry, and this volume continues with a collection of state-of-the-art advances and studies of the highest caliber.19b were calculated for different values of the film thickness, L, and a constant value of the roughness correlation length, nH, according to Eq. (49). Lines 1 and ... 19 shows that there is no way to fit the experimental data assuming that only one type of roughness is presented on the surface. We are thus ... Here we should emphasize only one point of major importance for electrochemical use of the QCM.
|Author||:||Allen J. Bard, Israel Rubinstein|
|Publisher||:||CRC Press - 2003-11-18|