Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.accurate simulation and comparing several alternative fixes also increase the chances of successfully repairing the circuit even further. In this section we first describe two techniques that can automatically find a variety of electrical error repairanbsp;...
|Title||:||Functional Design Errors in Digital Circuits|
|Author||:||Kai-hui Chang, Igor L. Markov, Valeria Bertacco|
|Publisher||:||Springer Science & Business Media - 2008-12-02|