International Test Conference 1995

International Test Conference 1995

4.11 - 1251 ratings - Source

A sensitive transient current detection (TCD) circuit has been developed, which uses a fast current comparator architecture. It has a ... 697-706, July 1982 [3] R. Iyer and D. Rossetti, aquot;A Measurement Based Model for Workload Dependence of CPU Errorsaquot;, IEEE Trans, ... [7] A. J. Van de Goor, aquot;Testing Semiconductor Memories Theory and Practiceaquot;, John Wiley aamp; Sons Ltd., West Sussex, England, 1991.

Title:International Test Conference 1995
Publisher: - 1996


You Must CONTINUE and create a free account to access unlimited downloads & streaming