ISTFA 2014

ISTFA 2014

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.We have developed a Matlab routine that allows transferring contour data in Haidenhain-CNC-code used by our ... eliminate outliers, because considering of these pixels could lead to destruction of the sample in the milling process, if theanbsp;...

Title:ISTFA 2014
Publisher:ASM International - 2014-11-01


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