This book features the official proceedings of the third international conference on this topic.D. G. Ford, S. R. Postlethwaite. However, the task of two dimensional edge detection and thresholding are too time consuming to be carried out by a microcontroller. The design ... These processes help to eliminate the effect of disparate contrast caused by variable ambient lighting conditions and obstacle surfaces. Verticalanbsp;...
|Title||:||Laser metrology and machine performance III|
|Author||:||D. G. Ford, S. R. Postlethwaite|