Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools. .The schematic diagram of this circuit is shown in Fig. 7.39. Also, the scheme achieves a small swing in address lines with a short pulse-driven pull-up transistor with a level holder of half-VINT power. The pull-up for the reduced swing bus lineanbsp;...
|Title||:||Memory, Microprocessor, and ASIC|
|Publisher||:||CRC Press - 2003-03-26|