Microelectronic Failure Analysis

Microelectronic Failure Analysis

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Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth edD. Neamen, Electronic Circuit Analysis and Apagt;es/a#39;g/j._Richard D. Irwin Pub., Chicago (McGraw-Hill), 1996 15. R.C. Jaeger, Microelectronic Design, McGraw- Hill, 1997 Bipolar Device and Analog Circuit Characterization Steve Frank Texas anbsp;...

Title:Microelectronic Failure Analysis
Author:Richard J. Ross, Christian Boit, Donald Staab
Publisher:Asm International - 1999-01


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