Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth edD. Neamen, Electronic Circuit Analysis and Apagt;es/a#39;g/j._Richard D. Irwin Pub., Chicago (McGraw-Hill), 1996 15. R.C. Jaeger, Microelectronic Design, McGraw- Hill, 1997 Bipolar Device and Analog Circuit Characterization Steve Frank Texas anbsp;...
|Title||:||Microelectronic Failure Analysis|
|Author||:||Richard J. Ross, Christian Boit, Donald Staab|
|Publisher||:||Asm International - 1999-01|