The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.Off-axis electron holograms were acquired using a Philips CM300-ST field- emission gun transmission electron microscope (FEGTEM) ... The holograms were formed using a Lorentz mini lens with the objective lens turned off and a rotatable MApllenstedt-Duker biprism located in ... Figure 1b shows a schematic diagram of the process used to reconstruct phase and amplitude images. ... 222 D. Cooper et al.
|Title||:||Microscopy of Semiconducting Materials|
|Author||:||A.G. Cullis, John L. Hutchison|
|Publisher||:||Springer Science & Business Media - 2006-08-25|