Line Software-Based Self-Testing of Embedded Processor Cores Session 9: On Compaction-Based Concurrent Error ... Low-cost in-field testing requirements, particularly small test execution time and low power consumption guide the ... High manufacturing test quality for embedded cores requires at-speed testing to detect defects that manifest themselves only in the actual speed of operation of theanbsp;...
|Title||:||On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE|
|Publisher||:||Institute of Electrical & Electronics Engineers(IEEE) - 2003|