Proceedings Tencon

Proceedings Tencon

4.11 - 1251 ratings - Source

Hyong-Gon Lee. and Jin-Ki Kim Semiconductor Research aamp; Development Center Samsung Seai conductor aamp; Te ... A novel reliable EEPROM redundancy circuit and test circuits for the screen of defective cells are also designed into the chip. ... power supply. cost effective plastic package, fast programming speed, and typically more than 10.8(1 program/ erase cycle ... graded junctions are selectively foraed by a double ion implant technique- Figure 1 is functional block diagram of theanbsp;...

Title:Proceedings Tencon
Publisher: - 1987


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