The book develops the root-cause approach to reliability - often referred to as qphysics of failureq in the reliability engineering field. It approaches the subject from the point of view of a process and integrates the necessary methods to support that process. The book can be used to teach first- or second-year postgraduate students in mechanical, electrical, manufacturing and materials engineering about addressing issues of reliability during product development. It will also serve practicing engineers involved in the design and development of electrical and mechanical components and systems, as a reference.... microvoid coalescence 116 MIL-HNDBK-217 61 MIL-STD-1629 84 Minera#39;s Rule 131 MLE, see Maximum Likelihood Estimation models ... PACTS, see process controls and tests Paris Equation 137 parting 195 passivation 183 passivation layer 217 pdf, see probability ... 122 solder 13, 120 fatigue 208 solder joints 13 fatigue 208, 210 spalling 138 SPC, see statistical process control standard deviationanbsp;...
|Title||:||Product Integrity and Reliability in Design|
|Author||:||John W. Evans, Jillian Y. Evans|
|Publisher||:||Springer Science & Business Media - 2011-06-28|