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3] C. L. Axness, H. T. Weaver, J. S. Fu, R. Koga and W. A. Kolasinski, aquot; Mechanisms leading to single event upset, aquot; IEEE Tran. ... II] I. Nashiyama, T. Hirao, T. Kamiya, H. Yutoh, T. Nishijima and H. Sekiguti, aquot;Single-event current transients induced by high energy ... 13] J. S. Laird, T. Hirao, S. Onoda, H. Mori, and H. Itoh, aquot;Temperature Dependence of Heavy Ion-Induced Current Transients in Si ... 15] S. M. Sze, Physics of Semiconductor Device. ... 24] ISE TCAD Dessis 7.0 manual, 2001.

Title:RADECS ...
Publisher: - 2004


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