This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.This information is crucial for the output PDF modeling procedure that is presented in the following section. ... (7.28) If the PDF of the local gate output g for the worst-case logic-0 (logic-1) is marked as h Im, max0 (h Im, min 1) and hp, 0aa (h p, 1aa), the PDF at the output of g for 0 a a (1 - a) propagation error hg, max0 and he mini 112 7 Statistical Evaluation of Fault Tolerance Using Probability Densityanbsp;...
|Title||:||Reliability of Nanoscale Circuits and Systems|
|Author||:||Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici|
|Publisher||:||Springer Science & Business Media - 2010-10-20|