This volume is the first complete overview of VLSI design methods that use statistical techniques for dealing with the random phenomena that are inherent in all VLSI manufacturing processes. VLSI design today cannot be performed without taking into account economic-related issues such as yield, cost and performance oriented tradeoffs. The book includes practical methods relevant to real life applications. It contains edited papers by top industrial and academic specialists in the field. These papers describe all three categories of CAD tools employed for statistical design: IC performance optimization tools, process simulation tools and tools for characterization of process fluctuations. In each category both practical approaches and more theoretical approaches are presented.S.R. Nassif, A.J. Strojwas, and S.W. Director, aquot;FABRICS II-Usera#39;s Manual, A Program for the Statistical Simulation of the IC Fabrication Processaquot;, Research Report No. ... L.W. Nagel, aquot;SPICE:A Computer Program to Simulate Semiconductor Circuitsaquot;, Electronics Research Laboratory, ... K.K. Low, aquot;PED: A Graphics Process Editoraquot;, Mastera#39;s Thesis, ECE Dept., CMU, 1985. ... S.W. Director and R.A. Rohrer, aquot;A Generalized Adjoint Network and Network Sensitivitiesaquot;, IEEE Trans, on CT, vol.
|Title||:||Statistical approach to VLSI|
|Author||:||Stephen W. Director, W. Maly|
|Publisher||:||North Holland - 1994|