The structure of a computing system presents unique problems when it fails to operate correctly and requires testing. This concise, yet comprehensive book describes the major test methods in current use, and their development from basic principles. Examines the sequence of tests which, built on each other, provide a suitable vehicle for testing digital systems, and the various types of testing equipment that should be applied for specific tests. An excellent introduction for those entering this increasingly complex world, the text will provide the reader with a firm basis on which to judge future development.If one of the output transistors in the gates G1 to G3 becomes permanently shorted to ground, then a logic probe can be used to ascertain the fact that the node is always low, no matter what the state of the inputs A to F, but it cannot be used toanbsp;...
|Title||:||Troubleshooting on Microprocessor Based Systems|
|Author||:||G. B. Williams|
|Publisher||:||Elsevier - 2013-10-22|