VLSI Design and Test

VLSI Design and Test

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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.An Efficient RF Energy Harvester with Tuned Matching Circuit Sachin Agrawal, Sunil Pandey, Jawar Singh, and P.N. ... Wireless battery charging system as discussed in[2], shows the concept of charging a cellular phone battery, usinganbsp;...

Title:VLSI Design and Test
Author:Singh Manoj Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh
Publisher:Springer - 2013-12-13


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